Title of Paper:Spatial-frequency spectrum characteristics analysis with different lift-offs for Microwave Non-destructive Testing and Evaluation using Itakura-Saito Nonnegative Matrix Factorization

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Journal:IEEE Sensors Journal

Abstract:Microwave non-destructive testing and evaluation (NDT&E) has tremendous potential for defect detection in metallic materials. In this paper: 1) An open-ended waveguide based scanning system operating in the X-band (8.2GHz to 12.4GHz) with a spatial-frequency feature extraction algorithm for defect detection at large lift-offs is presented; 2) A full mathematical derivation for modelling the spatial-frequency characteristics in the presence of defects and without defects is provided; 3) A spatial-frequency feature extraction algorithm using the NMF developed and investigated.

All the Authors: Anthony Simm, W.L. Woo, Gui Yun Tian, Bin Gao,Hong Zhang

Correspondence Author:Bin Gao

Volume:14

Issue:6

Page Number:1822 – 1830

Translation or Not:no

Date of Publication:2014-04-14