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发表刊物：IEEE Sensors Journal

摘要：Induction Thermography has been applied as an emerging Non-Destructive Testing and Evaluation (NDT&E) technique for a wide range of conductive materials. The IR vision sensing acquired image sequences contain valuable information in both spatial and time domain. However, automatic and precisely extracting defect pattern from thermal video remains a challenge. In order to accurately find anomalous patterns for defect detection and further quantitative NDE, we propose automatic relevance determination approach with adaptive variational Bayes for sub-group sparse decomposition.

备注：Code is attached

全部作者：Peng Lu, Wai Lok Woo, Gui Yun Tian

通讯作者：Bin Gao

卷号：17

期号：16

页面范围：5220-5230

是否译文：否

发表时间：2017-08-15