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    高斌

    • 教授 博士生导师
    • 性别:男
    • 毕业院校:英国纽卡斯尔大学
    • 学历:博士研究生毕业
    • 学位:哲学博士学位
    • 在职信息:在岗
    • 所在单位:自动化工程学院
    • 学科:信号与信息处理
      测试计量技术及仪器
      检测技术与自动化装置
    • 办公地点:C2-403
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    Quantitative Validation of Eddy Current Stimulated Thermal Features on Surface Crack

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    发表刊物:NDT& E international

    摘要:Thermography is an established technique in Non-Destructive Testing and Evaluation (NDT&E) for detecting and visualizing defects. The acquired thermal image sequences contain valuable information in the spatial, time and frequency domains. Many thermal feature extraction methods have been previously proposed to detect and quantify defects. However, the quantitative assessment and error analysis remain as challenges. In the present work, a quantitative analysis strategy is proposed for validating detection performance of various thermal feature extraction techniques based on ECPT.

    全部作者: Xiaoqing Li, W.L. Woo, Gui Yun Tian

    通讯作者:Bin Gao

    卷号:85

    页面范围:1-12

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    发表时间:2016-09-20