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    高斌

    • 教授 博士生导师
    • 性别:男
    • 毕业院校:英国纽卡斯尔大学
    • 学历:博士研究生毕业
    • 学位:哲学博士学位
    • 在职信息:在岗
    • 所在单位:自动化工程学院
    • 学科:信号与信息处理
      测试计量技术及仪器
      检测技术与自动化装置
    • 办公地点:C2-403
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    Metal Defects Sizing and Detection under Thick Coating Using Microwave NDT

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    发表刊物:NDT & E International

    摘要:An experimental study to evaluate shapes and sizes of defect under thick coating by microwaves NDT is demonstrated. Specially fabricated thick fire protect coated steel panels with embedded defects are inspected using an X-band (8.2GHz-12.4GHz) open-ended rectangular waveguide. The fundamental idea behind using this probe is presented along with several experimental results to validate this method for defect detection under coating. The reflected signal related to the phase and magnitude of the reflection coefficient at the waveguide aperture is used to create images.

    全部作者: Libing Bai, W.L. Woo, Gui Yun Tian, Bin Gao,Hong Zhang

    通讯作者:Bin Gao

    学科门类:工学

    卷号:60

    页面范围:52–61

    是否译文:

    发表时间:2013-07-21