杜江锋
Professor

Gender:Male

Alma Mater:University of Electronic Science and Technology of China

Education Level:With Certificate of Graduation for Doctorate Study

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Paper Publications

[39] Zhiyuan Bai, Jiangfeng Du*, Yong Liu, Qi Xin, Yang Liu, Qi Yu. "Study on the electrical degradation of AlGaN/GaN MIS-HEMTs induced by residual stress of SiNx passivation", Solid-State Electronics, 133 : 31–37 (2017) .(SCI)

Release time:2019-01-21 Hits:

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