Affiliation of Author(s):[1]Univ Elect Sci & Technol China, State Key Lab Elect Thin Films & Integrated Device, Chengdu 610054, Peoples R China;[2]Chengdu Univ Informat Technol, Informat Mat & Device Applicat Key Lab Sichuan Pro, Chengdu 610225, Peoples R China;[3]Univ Elect Sci & Technol China, Yangtze Delta Reg Inst Huzhou, Huzhou, Peoples R China
Journal:JOURNAL OF ALLOYS AND COMPOUNDS
Key Words:LTCC; Ceramic substrate; Microwave dielectric properties; Static microwave imaging
Abstract:Microwave imaging has the advantages of high accuracy, non-contact and damage-free, but this puts for-ward higher requirements on the materials of imaging devices. Here, a novel Zn0.96Cu0.oMoO4 ceramic reported using a solid-state reaction process. The substitution behavior and microwave dielectric properties of the ceramic are systematically investigated by the crystal structure, microscopic morphology, and Raman spectroscopy. It exhibits excellent microwave dielectric properties (epsilon r = 8.66, Qxf = 32024 GHz, and tau f -58.1 ppm/degrees C) sintered at 825 degrees C. A 40 x 40 microstructure array for static microwave imaging is designed and demonstrated based on this ceramic substrate. The maximum spin-selective reflection difference of the LCP and RCP waves at 9.6 GHz is 0.926. The image of a Chinese character presented has a recognizable resolution, both from intensity differences and three-dimensional (3D) electric field arrows. The pair of mutually chiral microstructures have an angular space of 6 degrees for experimental manipulation. This work opens up the application of microwave dielectric ceramics in the imaging field.(c) 2023 Elsevier B.V. All rights reserved.
Document Type:Article
Volume:945
ISSN No.:0925-8388
Translation or Not:no