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Wavelength-drop properties of L-type defects in photonic bandgap structure for the terahertz regime

点击次数:发表时间:2025-05-23

  • 所属单位:[1]Univ Elect Sci & Technol China, State Key Lab Elect Thin Film & Integrated Device, Chengdu 610054, Sichuan, Peoples R China
  • 发表刊物:OPTICAL AND QUANTUM ELECTRONICS
  • 关键字:Photonic band gap; L-type defects; Wavelength-drop properties; Terahertz
  • 摘要:Using the finite difference time domain method, the electromagnetic field distribution of terahertz waves are simulated in photonic band gap structures with different single-defect, line-shaped defects and L-type defects composed of three single-defects. Introducing the photonic band gap structure with difference coordinates single-defects, the resonance frequency and amplitude of the single-defect along the vertical direction of line-shaped defects waveguide have more sensitive than the parallel direction. Introducing the photonic band gap structure with line-shaped defects composed of three defects, the resonant in the endpoint of line-shaped defects have high amplitude and in the middle of line-shaped defects have two resonant frequencies. Introducing the photonic band gap structure with L-type defects composed of three defects, three high-Q resonant frequencies appeared simultaneously in the some monitor coordinates.
  • 文献类型:Article
  • 卷号:41
  • 期号:3
  • 页面范围:159-168
  • ISSN号:0306-8919
  • 是否译文:否
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  • 性别:男
  • 职称:教授
  • 毕业院校:电子科技大学
  • 学历:博士研究生毕业
  • 学位:工学博士学位
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  • 2012  当选: 新世纪优秀人才计划

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