杨成林
开通时间:..
最后更新时间:..
点击次数:
备注:IEEE Transactions On Instrumentation And Measurement, 2013,62(10):2730-2738
全部作者:Fang Chen., Jianguo Huang, Zhen Liu, Shulin Tian,Chenglin Yang
是否译文:否
上一条:Methods of handling the tolerance and test-point selection problem for analog-circuit fault diagnosis (70).
下一条:Complex Field Fault Modeling Based Optimal Frequency Selection in Linear Analog Circuit Fault Diagnosis(20).