杨成林
开通时间:..
最后更新时间:..
点击次数:
备注:IEEE Transactions On Instrumentation And Measurement, 2009, 58(7):2145-2158
全部作者: Bing Long., Shulin Tian,Chenglin Yang
是否译文:否
上一条:A test points selection method for analog fault dictionary techniques (53)
下一条:Methods of handling the tolerance and test-point selection problem for analog-circuit fault diagnosis (70).