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153. Xie DZ, Ngoi BKA, Ong AS, Yongqi Fu, Focused ion beam micromachining of TiNi film on Si(111). Nucl. Instrum. Meth. B 211 (3): 363-368 (Nov. 2003).

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Pre One:154. Xie DZ, Ngoi BKA, Yongqi Fu, Ong AS, B.H. Lim, Etching characteristics of TiNi thin film by focused ion beam. Applied Surface Science. 225 (1-4) 54-58 (March 2004).

Next One:152. Hung N.P., Yongqi Fu, and Ali M.Y., Focused ion beam machining of silicon, Journal of Materials Processing Technology, 127 (2), 256-260, 2002.

Stephen Fu

Gender:Male Education Level:With Certificate of Graduation for Doctorate Study Degree:Doctor of Engineering Status:On the job E-Mail:

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