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发表刊物：J. Appl. Phys
第一作者： D. Viehlan, S. X. Dong, M. I. Bichurin,C. W. Nan
卷号：103
页面范围：031101
是否译文：否
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下一条：Physics-guided intelligent tomography sensing system for non-destructive testing based on neuromorphic eddy current circuit array and physical electromagnetic dynamics model
