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上一条:Yongqi Fu, Ngoi Kok Ann Bryan, Ong Nan Shing, Investigation of submicron linewidth direct deposition for high-density IC chip modification by focused ion beam. International Journal of Advanced Manufacturing Technology. Vol.17. No.11, pp. 835-839 (2001).
下一条:Yongqi Fu, Ngoi Kok Ann Bryan, Characterization of focused ion beam induced deposition process and parameters calibration. Sensors and Actuators, A Physical. Vol.88, No.1, pp.58-66, 20 January 2001.