付永启
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上一条:Hung N.P., Ali M.Y., Y.Q. Fu, Ong N.S. and Tay M.L, Surface Integrity and Removal Rate of Silicon Sputtered with Focused Ion Beam, Journal of Machining Science and Technology, Vol. 5(2), pp. 239-254 (2001).
下一条:Yongqi Fu and Xiuli Zhou, Investigation of Aspect Ratio of Hole Drilling From Micro to Nanoscale via Focused Ion Beam Fine Milling , International Journal of Nanomanufacturing, (2010). (in press)