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上一条:Xie DZ, Ngoi BKA, Yongqi Fu, Ong AS, B.H. Lim, Etching characteristics of TiNi thin film by focused ion beam. Applied Surface Science. 225 (1-4) 54-58 (March 2004).
下一条:Hung N.P., Yongqi Fu, and Ali M.Y., Focused ion beam machining of silicon, Journal of Materials Processing Technology, 127 (2), 256-260, 2002.