Title of Paper:Smooth Nonnegative Matrix Factorization for defect detection using Microwave Non-destructive Testing and Evaluation

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Journal:IEEE Transactions on Instrumentation and Measurement

Abstract:This paper addresses the interpolation issue of current spectral estimation methods in Microwave-based non-destructive testing and evaluation (NDT&E).  We developed a spatial-frequency feature extraction algorithm for defect detection with an open-ended waveguide system using Smooth Itakura-Saito Nonnegative Matrix Factorization (S-ISNMF).  In addition, the mathematical models of spatial-frequency characteristics for both defects and non-defects areas are derived. The newly developed algorithm has two prominent characteristics which benefits the detection system.

All the Authors:Bin Gao, Hong Zhang, W.L. Woo, Gui Yun Tian, Libing Bai, Aijun Yin

Discipline:Engineering

Volume:63

Issue:4

Page Number:923 – 934

Translation or Not:no

Date of Publication:2014-03-06