Error-Feedback Mismatch Error Shaping for High-Resolution Data Converters
- 所属单位：
UESTC
- 教研室：
CRFICS
- 发表刊物：
IEEE Transactions on Circuits and Systems I: Regular Papers
- 关键字：
Capacitors , Dynamic range , Complexity theory , Hardware , Calibration , Linearity , Quantization (
- 摘要：
Device mismatch is a key concern for high-resolution data converters. This paper presents a comprehensive study of the error-feedback (EF)-based mismatch error shaping (MES) technique. EF MES overcomes the key challenge of the classic dynamic element matching-based MES whose complexity grows exponentially with the number of bits; however, the prior EF MES comes with the limitations of limited shaping capability and reduced dynamic range. This paper demonstrates how to perform more advanced EF MES for various types of data converters. Moreover, this paper also proposes the use of digital predic
- 论文类型：
应用研究
- 卷号：
66
- 期号：
4
- 页面范围：
1342-1354
- 是否译文：
否
- 发表时间：
2018-11-28
