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138. Yongqi Fu, Ngoi Kok Ann Bryan, Ong Nan Shing, Influence analysis of dwell time on focused ion beam micromachining in silicon. Sensors and Actuators, A Physical, Vol. 79, No.3, pp.230~234 (2000).

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Pre One:139. Yongqi Fu, Ngoi Kok Ann Bryan, Characterization of focused ion beam induced deposition process and parameters calibration. Sensors and Actuators, A Physical. Vol.88, No.1, pp.58-66, 20 January 2001.

Next One:137. Yongqi Fu, Ngoi Kok Ann Bryan, Compensation of shadow effect for microfabrication of diffractive structures. Review of Scientific Instruments, Vol.76, No.9, 093116 (September 2005).

Stephen Fu

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