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139. Yongqi Fu, Ngoi Kok Ann Bryan, Characterization of focused ion beam induced deposition process and parameters calibration. Sensors and Actuators, A Physical. Vol.88, No.1, pp.58-66, 20 January 2001.

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Pre One:140. Yongqi Fu, Ngoi Kok Ann Bryan, Data format transferring for FIB microfabrication. International Journal of Advanced Manufacturing Technology. Vol.16, No.8, pp.600-602 (2000).

Next One:138. Yongqi Fu, Ngoi Kok Ann Bryan, Ong Nan Shing, Influence analysis of dwell time on focused ion beam micromachining in silicon. Sensors and Actuators, A Physical, Vol. 79, No.3, pp.230~234 (2000).

Stephen Fu

Gender:Male Education Level:With Certificate of Graduation for Doctorate Study Degree:Doctor of Engineering Status:On the job E-Mail:

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