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141. Yongqi Fu, Ngoi Kok Ann Bryan, Ong Nan Shing, Investigation of submicron linewidth direct deposition for high-density IC chip modification by focused ion beam. International Journal of Advanced Manufacturing Technology. Vol.17. No.11, pp. 835-839 (2001).

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Pre One:142. Yongqi Fu, Ngoi Kok Ann Bryan, Ong Nan Shing, Investigation of 3D microfabrication characteristics by focused ion beam technology in silicon. Journal of Material Processing Technology. Vol.104, No.2, pp.44-47 (2000).

Next One:140. Yongqi Fu, Ngoi Kok Ann Bryan, Data format transferring for FIB microfabrication. International Journal of Advanced Manufacturing Technology. Vol.16, No.8, pp.600-602 (2000).

Stephen Fu

Gender:Male Education Level:With Certificate of Graduation for Doctorate Study Degree:Doctor of Engineering Status:On the job E-Mail:

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