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142. Yongqi Fu, Ngoi Kok Ann Bryan, Ong Nan Shing, Investigation of 3D microfabrication characteristics by focused ion beam technology in silicon. Journal of Material Processing Technology. Vol.104, No.2, pp.44-47 (2000).

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Pre One:143. Yongqi Fu, Ngoi Kok Ann Bryan, Influence of redeposition effect for focused ion beam three-dimensional micromachining. International Journal of Advanced Manufacturing Technology. Vol.16. No.12, pp. 877~880 (2000).

Next One:141. Yongqi Fu, Ngoi Kok Ann Bryan, Ong Nan Shing, Investigation of submicron linewidth direct deposition for high-density IC chip modification by focused ion beam. International Journal of Advanced Manufacturing Technology. Vol.17. No.11, pp. 835-839 (2001).

Stephen Fu

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