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143. Yongqi Fu, Ngoi Kok Ann Bryan, Influence of redeposition effect for focused ion beam three-dimensional micromachining. International Journal of Advanced Manufacturing Technology. Vol.16. No.12, pp. 877~880 (2000).

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Pre One:144. Yongqi Fu, Ngoi Kok Ann Bryan, Zhongwei Shen, A novel harmless trimming for micro-device with defects and particles in arbitrary geometry by fine milling of focused ion beam. Microelectronics Journal, Vol.35 (2), 111-115 (Feb. 2004).

Next One:142. Yongqi Fu, Ngoi Kok Ann Bryan, Ong Nan Shing, Investigation of 3D microfabrication characteristics by focused ion beam technology in silicon. Journal of Material Processing Technology. Vol.104, No.2, pp.44-47 (2000).

Stephen Fu

Gender:Male Education Level:With Certificate of Graduation for Doctorate Study Degree:Doctor of Engineering Status:On the job E-Mail:

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