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144. Yongqi Fu, Ngoi Kok Ann Bryan, Zhongwei Shen, A novel harmless trimming for micro-device with defects and particles in arbitrary geometry by fine milling of focused ion beam. Microelectronics Journal, Vol.35 (2), 111-115 (Feb. 2004).

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Pre One:145. Yongqi Fu, Ngoi Kok Ann Bryan, Wei Zhou, Dongzhu Xie, Lim Boon Hong, Investigation of surface features on BK7 glass via focused ion beam bombardment. International Journal for Manufacturing Science and Technology, Vol.6, No.2, pp.12-18 (2005).

Next One:143. Yongqi Fu, Ngoi Kok Ann Bryan, Influence of redeposition effect for focused ion beam three-dimensional micromachining. International Journal of Advanced Manufacturing Technology. Vol.16. No.12, pp. 877~880 (2000).

Stephen Fu

Gender:Male Education Level:With Certificate of Graduation for Doctorate Study Degree:Doctor of Engineering Status:On the job E-Mail:

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