- Y. Zhao, T. Kim, H. Shin, S. Tan, X. Li, H. Chen, H. Wang, "Statistical Rare-Event Analysis and Parameter Guidance by Elite Learning Sample Selection"
发表刊物:ACM Transactions on Design Automation of Electronic Systems (TODAES), CCF B类期刊
卷号:21
期号:4
页面范围:56:1-56:21
是否译文:否
发表时间:2016-05-01
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