- L. Zhang, H. Wang, et al., "Fast stress analysis for runtime reliability enhancement of 3D IC using artificial neural network"
发表刊物:International Symposium on Quality Electronic Design (ISQED)
页面范围:173-178
是否译文:否
发表时间:2016-03-01
上一条:- H. Zhao, Z. Qi, S. Wang, K. Vafai, H. Wang, H. Chen, S. Tan, "Learning-based occupancy behavior detection for smart buildings"
下一条:- K. He, S. Tan, H. Wang, G. Shi, "GPU-accelerated parallel sparse LU factorization method for fast circuit analysis"