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Drift of MEMS Closed-Loop Accelerometers Induced by Dielectric Charging

2022-12-28 Hits:

Journal:IEEE Transactions on Instrumentation and Measurement

All the Authors:Xiaoping He,Huijun Yu,Longqi Ran

First Author:Jiangbo He

Correspondence Author:Wu Zhou*

Document Code:7503707

Volume:70

Page Number:7503707

Translation or Not:no

Date of Publication:2021-08-03

Date of Publication:2021-08-03

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周吴

Gender:Male Education Level:With Certificate of Graduation for Doctorate Study Alma Mater:Southwest Jiaotong University Degree:Doctor of Engineering Status:On the job School/Department:University of Electronic Science and Technology of China E-Mail:

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