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上一条:Yongqi Fu, Ngoi Kok Ann Bryan, Influence of redeposition effect for focused ion beam three-dimensional micromachining. International Journal of Advanced Manufacturing Technology. Vol.16. No.12, pp. 877~880 (2000).
下一条:Yongqi Fu, Ngoi Kok Ann Bryan, Ong Nan Shing, Investigation of submicron linewidth direct deposition for high-density IC chip modification by focused ion beam. International Journal of Advanced Manufacturing Technology. Vol.17. No.11, pp. 835-839 (2001).