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上一条:Yongqi Fu, Ngoi Kok Ann Bryan, Zhongwei Shen, A novel harmless trimming for micro-device with defects and particles in arbitrary geometry by fine milling of focused ion beam. Microelectronics Journal, Vol.35 (2), 111-115 (Feb. 2004).
下一条:Yongqi Fu, Ngoi Kok Ann Bryan, Ong Nan Shing, Investigation of 3D microfabrication characteristics by focused ion beam technology in silicon. Journal of Material Processing Technology. Vol.104, No.2, pp.44-47 (2000).