王海
213
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发表刊物:IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)
页面范围:221-223
是否译文:否
发表时间:2016-10-01
附件:
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上一条:- Y. Ye, T. Kim, H. Chen, H. Wang, E. Tlelo-Cuantle, S. Tan, "Comprehensive Detection of Counterfeit ICs Via On-Chip Sensor and Post-Fabrication Authentication Policy"
下一条:- J. Wan, H. Wang, et al., "A fast full-chip static power estimation method"