王海
250
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教授
博士生导师
- 性别：男
- 毕业院校：美国加州大学
- 学历：博士研究生毕业
- 学位：哲学博士学位
- 在职信息：在职人员
- 所在单位：集成电路科学与工程学院（示范性微电子学院）
- 办公地点：Build. 211, Rm. 1204
- 联系方式：+86-28-83201593
- 电子邮箱：wanghai@uestc.edu.cn
访问量 ：
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[1]
研究简介
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[2]
- H. Wang, X. Long, and X.-X. Liu, "FastESN: Fast echo state network", IEEE Transactions on Neural Networks and Learning Systems (中科院一区top期刊，影响因子10.4，CCF B类期刊),
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[3]
- H. Wang, W. He, Q. Yang, X. Peng, and H. Tang, "DBP: Distributed power budgeting for many-core systems in dark silicon", IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (CCF A类期刊), Apr 2022.
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[4]
- H. Wang, W. Li, W. Qi, et al., "Runtime performance optimization of 3-D microprocessors in dark silicon", IEEE Transactions on Computers (CCF A类期刊), Aug 2020.
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[5]
- H. Wang, L. Hu, X. Guo, et al., "Compact Piecewise Linear Model Based Temperature Control of Multi-Core Systems Considering Leakage Power", IEEE Transactions on Industrial Informatics (TII)，一区top期刊, Dec 2019.
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[6]
- H. Wang, T. Xiao, D. Huang, L. Zhang, et al., "Runtime stress estimation for 3D IC reliability management using artificial neural network", ACM Transactions on Design Automation of Electronics Systems (TODAES), CCF B类期刊, Nov 2019.
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[7]
- H. Wang, X. Guo, et al., "Leakage-Aware Predictive Thermal Management for Multi-Core Systems Using Echo State Network", IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), CCF A类期刊, Apr 2019.
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[8]
- H. Wang, D. Tang, et al., "GDP: A greedy based dynamic power budgeting method for multi/many-core systems in dark silicon", IEEE Transactions on Computers (TC), CCF A类期刊, vol. 68, no. 4, pp. 526-541, Apr 2019.
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[9]
- X. Guo, H. Wang, et al., "Leakage-Aware Thermal Management for Multi-Core Systems Using Piecewise Linear Model Based Predictive Control", Asia and South Pacific Design Automation Conference (ASP-DAC), CCF C类会议, 最佳论文候选, Jan 2019.
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[10]
- H. Wang, D. Huang, et al., "STREAM: Stress and thermal aware reliability management for 3D-ICs", IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), CCF A类期刊, Oct 2018.
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[11]
- H. Wang, J. Wan, et al., "A fast leakage-aware full-chip transient thermal estimation method", IEEE Transactions on Computers (TC), CCF A类期刊, vol. 67, no. 5, pp. 617-630, May 2018.
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[12]
- H. Wang, J. Ma, et al., "Hierarchical Dynamic Thermal Management Method for High-Performance Many-Core Microprocessors", ACM Transactions on Design Automation of Electronic Systems (TODAES), CCF B类期刊, vol. 22, no. 1, pp. 1:1-1:21, Jul 2016.
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[13]
- T. Kim, Z. Sun, H. Chen, H. Wang, S. Tan, "Energy and Lifetime Optimizations for Dark Silicon Manycore Microprocessor Considering Both Hard and Soft Errors", IEEE Transactions on Very Large Scale Integration (VLSI) Systems, CCF B类期刊, vol. 25, no. 9, pp. 2561-2574, Sep 2017.
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[14]
- Y. Ye, T. Kim, H. Chen, H. Wang, E. Tlelo-Cuantle, S. Tan, "Comprehensive Detection of Counterfeit ICs Via On-Chip Sensor and Post-Fabrication Authentication Policy", International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications for Circuit Design (SMACD), Jul 2017.
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[15]
- L. Xu, H. Wang, et al., "Distributed model predictive control for dynamic thermal management of multi-core systems", IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT), pp. 221-223, Oct 2016.
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[16]
- J. Wan, H. Wang, et al., "A fast full-chip static power estimation method", IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT), pp. 241-243, Oct 2016.
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[17]
- Y. Zhao, T. Kim, H. Shin, S. Tan, X. Li, H. Chen, H. Wang, "Statistical Rare-Event Analysis and Parameter Guidance by Elite Learning Sample Selection", ACM Transactions on Design Automation of Electronic Systems (TODAES), CCF B类期刊, vol. 21, no. 4, pp. 56:1-56:21, May 2016.
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[18]
- H. Zhao, Z. Qi, S. Wang, K. Vafai, H. Wang, H. Chen, S. Tan, "Learning-based occupancy behavior detection for smart buildings", IEEE International Symposium on Circuits and Systems (ISCAS), CCF C类会议, pp. 954-957, May 2016.
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[19]
- L. Zhang, H. Wang, et al., "Fast stress analysis for runtime reliability enhancement of 3D IC using artificial neural network", International Symposium on Quality Electronic Design (ISQED), pp. 173-178, Mar 2016.
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[20]
- K. He, S. Tan, H. Wang, G. Shi, "GPU-accelerated parallel sparse LU factorization method for fast circuit analysis", IEEE Transactions on Very Large Scale Integration (VLSI) Systems, CCF B类期刊, vol. 24, no. 3, pp. 1140-1150, Mar 2016.
