- Y. Zhao, T. Kim, H. Shin, S. Tan, X. Li, H. Chen, H. Wang, "Statistical Rare-Event Analysis and Parameter Guidance by Elite Learning Sample Selection"
发表刊物：ACM Transactions on Design Automation of Electronic Systems (TODAES), CCF B类期刊
卷号：21
期号：4
页面范围：56:1-56:21
是否译文：否
发表时间：2016-05-01
上一条：- J. Wan, H. Wang, et al., "A fast full-chip static power estimation method"
下一条：- H. Zhao, Z. Qi, S. Wang, K. Vafai, H. Wang, H. Chen, S. Tan, "Learning-based occupancy behavior detection for smart buildings"
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