周吴

个人信息Personal Information

教授 博士生导师

性别:男

毕业院校:西南交通大学

学历:博士研究生毕业

学位:工学博士学位

在职信息:在职人员

所在单位:机械与电气工程学院

入职时间:2010-08-20

学科:机械工程

办公地点:电子科技大学清水河校区成电国际创新中心B栋303

曾获荣誉:成都市“蓉漂”人才计划、深圳“鹏城孔雀计划”人才。

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2021年8月3日:团队何江波老师在《IEEE Transactions on Instrumentation and Measurement》上发表关于微加速度传感器漂移的论文,祝贺!!

发布时间:2024-09-24   点击次数:

In this work, the drifts of the bias and scale factor induced by the dielectric charging are studied for micro-electromechanical system (MEMS) closed-loop accelerometers. At first, the equations of the feedback electrostatic forces, including the built-in voltages resulted from the dielectric charging, are built up for the two capacitors of the accelerometers. Then, the models for the drifts of the bias and scale factor both are established. Based on the models and experimental data, it is found that the drift of the scale factor is always negative because the built-in voltages always decrease the scale factor. However, the drift of
the bias can be negative or positive because it is in proportion to the built-in voltages’ difference of the two capacitors, which may be negative or positive. The major output error for the small input acceleration is caused by the drift of the bias. However, for the large acceleration, the error induced by the drift of the scale factor is also vital. Finally, the method of choosing the frequency of the ac reference voltage for suppressing the dielectric charging based on the drift of the scale factor is established. The feasibility
is verified by the experimental data.