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Attenuation of the dielectric charging-induced drift in capacitive accelerometer by AC bias voltage
2022-12-28 Hits:Journal:J. Micro/ Nanolith. MEMS MOEMS
All the Authors:Huijun Yu,Peng Peng,Hao Wang,Xiaoping He
First Author:Hao Qu
Correspondence Author:Bei Peng*,Wu Zhou*
Document Code:035002
Volume:16
Issue:3
Translation or Not:no
Date of Publication:2017-08-19
Date of Publication:2017-08-19