付永启
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教授
博士生导师
- 性别：男
- 毕业院校：中国科学院长春光机所
- 学历：博士研究生毕业
- 学位：工学博士学位
- 在职信息：在职人员
- 所在单位：物理学院
- 入职时间： 2008-07-01
- 学科：光学
电子与通信工程
- 办公地点：清水河校区#4科研楼（物理学院）514房间
- 联系方式：8135d4f204521c12210ff1242f385ac78186a14d836fbd8f4b10e722a342834ccc9305b4b45b0e039788bc947e6e534f0cc8e4db1f2a4fd0b60a6d1253782f4302ee19002e19be503068d605ecb2393d837e1c7bb171bd661e0bcb7aed0da0556008a3a5014553e4a9f171b9934df4c10397056f0383b5a604494cedd58c7ecf
- 电子邮箱：8135d4f204521c12210ff1242f385ac78186a14d836fbd8f4b10e722a342834ccc9305b4b45b0e039788bc947e6e534f0cc8e4db1f2a4fd0b60a6d1253782f4302ee19002e19be503068d605ecb2393d837e1c7bb171bd661e0bcb7aed0da0556008a3a5014553e4a9f171b9934df4c10397056f0383b5a604494cedd58c7ecf
访问量：
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[21]
Yongqi Fu, Ngoi Kok Ann Bryan, Ong Nan Shing, Investigation of 3D microfabrication characteristics by focused ion beam technology in silicon. Journal of Material Processing Technology. Vol.104, No.2, pp.44-47 (2000).
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[22]
Yongqi Fu, Ngoi Kok Ann Bryan, Ong Nan Shing, Investigation of submicron linewidth direct deposition for high-density IC chip modification by focused ion beam. International Journal of Advanced Manufacturing Technology. Vol.17. No.11, pp. 835-839 (2001).
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[23]
Yongqi Fu, Ngoi Kok Ann Bryan, Data format transferring for FIB microfabrication. International Journal of Advanced Manufacturing Technology. Vol.16, No.8, pp.600-602 (2000).
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[24]
Yongqi Fu, Ngoi Kok Ann Bryan, Characterization of focused ion beam induced deposition process and parameters calibration. Sensors and Actuators, A Physical. Vol.88, No.1, pp.58-66, 20 January 2001.
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[25]
Yongqi Fu, Ngoi Kok Ann Bryan, Ong Nan Shing, Influence analysis of dwell time on focused ion beam micromachining in silicon. Sensors and Actuators, A Physical, Vol. 79, No.3, pp.230~234 (2000).
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[26]
Yongqi Fu, Ngoi Kok Ann Bryan, Compensation of shadow effect for microfabrication of diffractive structures. Review of Scientific Instruments, Vol.76, No.9, 093116 (September 2005).
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[27]
Yongqi Fu, Ngoi Kok Ann Bryan, Dongzhu Xie, Lim Boon Hong, Investigation of Microfabrication of Diamond-Like Film via Focused Ion Beam Milling. Review of Scientific Instruments. Vol.74, No. 8, pp.3689-3692 (August 1 2003).
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[28]
Yongqi Fu, Ngoi Kok Ann Bryan, Investigation of integrated diffractive/refractive microlens microfabricated by focused ion beam. Review of Scientific Instruments. Vol. 71, No.6, pp.2263-2266 (June 2000).
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[29]
Yongqi Fu, Ngoi Kok Ann Bryan, Ong Nan Shing, Nguyen Phu Hung, Calibration of etching uniformity for large aperture multilevel diffractive optical element by ion beam etching. Review of Scientific Instruments, Vol.71, No.2, pp1009-1011 (Feb. 2000).
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[30]
Yongqi Fu, Ngoi Kok Ann Bryan, Ong Nan Shing, Experimental Study of 3D Microfabrication by Focused Ion Beam. Review of Scientific Instruments, Vol.71, No.2, pp.1006-1008 (Feb. 2000).
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[31]
Yongqi Fu, Ngoi Kok Ann Bryan, Ong Nan Shing, Fabrication and characterization of nanopore array. Journal of Nanoscience and Nanotechnology, Vol.6, No.7, pp.1954-1960 (2006).
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[32]
Selected and republished online in Virtual Journal of Biological Physics Research, Vol.9, No.11, 1 June 2005.
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[33]
Yongqi Fu, Ngoi Kok Ann Bryan, Fabrication and characterization of slanted nanopillars array. Journal of Vacuum Sciences and Technology B, Vol.23, No.3, pp. 984-989 (May/June 2005).
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[34]
Yongqi Fu, Ngoi Kok Ann Bryan, Fabrication of three-dimensional microstructures by two-dimensional slice-by-slice approaching via focused ion beam milling. Journal of Vacuum Sciences and Technology B Vol.22, No.4, pp.1672-1678 (July/August 2004).
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[35]
Yongqi Fu, Ngoi Kok Ann Bryan, Experimental study of micro-cylindrical lens by focused ion beam technology. Journal of Vacuum Sciences and Technology B Vol.19, No.4, pp.1259-1263 (July/Aug. 2001).
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[36]
Shaolin Zhou, Song Hu, Yongqi Fu*, Xiangmin Xu, Jun Yang, Moiré interferometry approach with high alignment resolution in proximity photolithographic process, Applied Optics, 53(5), 951–959 (2014).
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[37]
Shaolin Zhou, Yongqi Fu, Xiaoping Tang, Wangfu Chen, Yong Yang, Fourier transformation based analysis of moiré fringe patterns of superposed gratings in alignment of nanolithography, Optics Express 16(11), 7869-7880 (26 May 2008).
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[38]
Xiaochun Dong, Chunlei Du, Shuhong Li, Changtao Wang, Yongqi Fu, Novel control approach for form accuracy of microlenses with continuous relief. Optics Express, 13(5), 1353-1360 (7 March 2005).
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[39]
Yongqi Fu, Ngoi Kok Ann Bryan, Semiconductor Microlenses Fabricated by One-Step Focused ion Beam Direct Writing. IEEE Transactions on Semiconductor manufacturing. Vol.15, No.2, pp.229-231 (May 2002).
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[40]
Yongqi Fu, Ngoi Kok Ann Bryan, A novel one step integration of edge-emitting laser diode with micro-elliptical lens using focused ion beam direct milling. IEEE Transactions on Semiconductor Manufacturing. Vol.15, No.1, pp.2-8 (Feb. 2002).
