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发表刊物：IEEE Journal of Solid-State Circuits (JSSC)

关键字：Calibration, cryogenic CMOS (Cryo-CMOS), quantum computing, R-2R DAC, single-electron transistor

摘要：Millions of quantum-bits (qubits) are envisioned for a fault-tolerant quantum computer. For scalability, silicon spin qubit stands out due to its compatibility with advanced CMOS processes. Silicon single-electron transistors (SETs) are widely adopted for the quantum state discrimination of spin qubits. For high-fidelity quantum logic gate and readout, the gate electrodes of the above Si quantum devices require a biasing voltage with ~10- μ V precision to define the electron occupation, and ultra-low noise to suppress the charge noise induced decoherence. In addition, the co-integration of a l

备注：https://ieeexplore.ieee.org/document/11434877

全部作者：Yifei Zhang,Haichuan Lin

第一作者：Yingjie Li

论文类型：Journal

通讯作者：Cheng Wang

论文编号：10.1109/JSSC.2026.3671795

学科门类：工学

一级学科：电子科学与技术

卷号：N/A

期号：N/A

页面范围：1-13

是否译文：否

发表时间：2026-03-16