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所属单位：Massachusetts Institute of Technology (MIT)

发表刊物：IEEE Journal of Solid-State Circuits (JSSC)

刊物所在地：USA

关键字：CMOS, frequency-comb, maximum power gain, molecular spectroscopy, slot line, terahertz (THz)

摘要：This paper describes the design and implementation of a 220-320 GHz spectrometer consisting of a pair of 65-nm CMOS chips. The spectrometer utilizes two counterpropagating frequency-comb signals to seamlessly scan the broadband spectrum and significantly reduces the total scanning time through high parallelism. The comb signal, with ten equally spaced frequency tones, is generated and detected by a chain of inter-locked transceivers on chip. The large reduction of required tuning range for each transceiver enables peak energy efficiency across a wide bandwidth.

备注：Firstly published on ISSCC 2017: https://ieeexplore.ieee.org/document/7870381
Later invited to JSSC: https://ieeexplore.ieee.org/document/8068932

第一作者：Cheng Wang

论文类型：期刊

通讯作者：Ruonan Han

论文编号：10.1109/JSSC.2017.2755693

学科门类：工学

一级学科：计算机科学与技术

卷号：52

期号：12

页面范围：3361-3372

是否译文：否

发表时间：2017-12-01